Hello everyone!
This is my first post, and I'm definitely a n00b at LabVIEW, but I'm a fast learner so hopefully this community can bear with me 🙂 I know I'm going to have alot of questions in the coming months, and I look forward to frequenting this board.
I have a PXI-6259 DAQ card installed in a PXIe-1062Q chassis, running to a SCC-68 terminal block. I'm using the terminal block to aquire a strain gage signal (using SCC-SG24 module for excitation) and a TC input (using the onboard CJC, created a global channel to reference it). The terminal block is being externally powered from a power supply at 5V. I was using a DAQ Express block to aquire and display the signals, and everything seemed to be working great.
I then tried to run a test to characterize some hardware (not using the load cell yet). The hardware is a metallic cylinder (a thermal storage unit, hereafter TSU) with a cartridge heater embedded into it. I was simply going to use the TC to log the TSU temperature over time. The TC was applied directly to the metallic surface of the TSU. The cartridge heater was being powered from a power supply, and was not grounded correctly. I started the VI, and as soon as I turned the TSU power supply on, the TC reading went to like 3.4k degrees. After the fact, I used a DMM and I can see that the TSU case (to which the TC was applied) sees a brief voltage spike when I first turn the power supply on (due to the incorrect grounding). Also when I try to read other analog inputs from the 6529, they're all pinned at 10.5V. I have gotten the TC channel to read correctly after my blunder, but it's flakey. Sometimes when I start the VI, the TC will read correctly, other times it will pin itself at 3.4k degrees and stay there. I've tried resetting/self-calibrating the card in MAX with no luck. Oddly, the load cell still seems to work.
Is my card ruined? Is there a test I can perform to verify that? Can NI repair broken cards?
Thanks everyone.
-Patrick
