newbie stdf question

[zumska]

Hi dear community. I am new to stdf.  I plan to parse and have datatable for PTR,PRR and then  join them together. e.g.

So in PRR it provides the x,y coordinates and the part_id,head_num,site_num

wafer_id	fabwf_id	part_typ	lot_id	head_num	site_num	part_flg	num_test	hard_bin	soft_bin	x_coord	y_coord	test_t	part_id
15			M9315	1	0	0	300	1	1	12	4	3293	1

And PTR provides the measurement result, head_num,site_num,test_num

	wafer_id	fabwf_id	part_typ	lot_id	test_num	head_num	site_num	result	test_txt
0	15		VO98-KK42-026C	M9315	11	1	0	1	PrintPgmInfo
1	15		VO98-KK42-026C	M9315	12	1	0	3.6	PrintPgmInfo  <> VDD

So how do I let say for a record in PTR maps it back to PRR and find the corresponding x,y coordinates and part_id ?

e.g. if I want to find

x_coord	y_coord	test_t	part_id
12	4	3293	1

The measurement result for

PrintPgmInfo  <> VDD

So I join head_num,site_num between them and find that result ?

But with the same head_num,site_num there are multiple parts with different X,Y coord.

So Does that mean that measurement apply to the whole group of that head_num,site_num ?

And all the Dies will have the same measurement with that group then ?

However, it seems it might not work..? I got feedback from two senior team members who are familar with stdf. There are their feedback:

"For STDF parsing, record sequence and location is critical.

PTR locate between PIR and PRR, results from PTR associate with PRR in the end of testing by head/site num, no other information in PTR related to PRR except head/site num. So PTR result and PRR cannot be joined if parsed separately."

"The PIR and PRR bracket information pertaining to one part. So all information between a PIR and PRR field belongs to one part. Between PIR and PRR there are typically a number of PTR, MPR, FTR records holding data of a single testrun on one sample."

If I cannot join the data between PRR and PTR how I would got the answer for my question?

What would be a specific test result pertaining a particular X,Y co-ordinate in a wafer for a specific test ??

-Thanks for all the help!

[SteveD123]

This is a forum for discussing National Instruments Labwindows\CVI development envionment for data aquisition. You appear to be discussing Standard Test Data Format, a proprietary file format for semiconductor test information. About which I know nothing.

How is this on-topic?

[chrisb94]

Hi,

This answer may be a little late, but perhaps it will be helpful.  

Each PTR is linked to the most recent PIR with the same head and site.  The next PRR with that same head and site completes the identification of the part started with the PIR.  Here is a simple example.  Note that no actual record numbers are in the file, I added them to help the explanation

record type head(head_num) site (site_num)

1 PIR head=1 site=1

2 PIR head=1 site=2

3 PTR  test 1 head=1 site= 1 (relates to part identified in record 1&7)

4 PTR test 2 head=1 site=1 (relates to part identified in record 1&7)

5 PTR test 1 head=1 site=2 (relates to part identified in record 2&8)

6 PTR test 2 head=1 site=2 (relates to part identified in record 2&8)

7 PRR head=1 site=1

8 PRR head=1 site=2

9 PIR head=1 site=1

10 PIR head=1 site = 2 ......

So to answer your questions

1) a PTR maps to the last PIR and next PRR with the same had & site

2) yes, as described in 1

3) There can be many parts with different x,y and id and same head/site

4) Each measurement applies to one part, as described in #1

5) No

Hope this helps.

thanks,

Chris