Modular Data Acquisition
Distributed Measurement and Control
High-Performance Test
Automated Test System Development Software
Perspectives showcases how NI sees what’s next in the world of test and technology.
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Provides support for NI data acquisition and signal conditioning devices.
Provides support for Ethernet, GPIB, serial, USB, and other types of instruments.
Provides support for NI GPIB controllers and NI embedded controllers with GPIB ports.
We are limping along on the ancient components works 3D graph that does suface plots. Any plans to move it out of the 90s?
Yes this would be great, and in WPF too.
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